Dileepan Joseph

Associate Professor

Phone: 780-492-9164
Email: dil.joseph@ualberta.ca
Office: W2-035 Elec & Comp Eng Rsch Facility
Office Hours: By appointment
Address: Personal Website

Research Interests

Vision is fundamental to intelligent activity in various sectors of the economy. Progress is necessary from image sensors to image understanding to enable and simplify the impossible and difficult visual tasks. In 2010-11, my Electronic Imaging Lab made important contributions to vision research and practical applications thereof.

Recent Contributions

As reported in the MDPI journal Sensors, we completed the design and testing of a vertically-integrated CMOS image sensor having wide dynamic range and low dark limit, specifications that are difficult to achieve, as reported in the SPIE Journal of Electronic Imaging. This work, part of a completed PhD thesis, led to an NSERC-funded partnership with IMRIS, a global leader in image-guided therapy solutions. Vertically-integrated CMOS technology is applied to design a low-dose X-ray imaging system.

In a second completed PhD thesis, we reported novel digital pixel sensors based on delta-sigma analog-to-digital converters (ADCs). Conventional digital cameras use analog pixels. Although analog pixels are smaller than digital pixels, technology trends indicate a clear progression toward digital pixels. We were the first to integrate complete delta-sigma ADCs, i.e., both modulators and decimators, into CMOS pixels. Delta-sigma ADCs are the preferred technology for high-fidelity digital audio.

As reported in the Journal of Microscopy, we also introduced a new technology called virtual reflected-light microscopy (VRLM). VRLM is a means to create powerful digital representations of opaque microscopic specimens. It employs computer vision methods to acquire reflection properties and shape from a set of specimen images. Digitized specimens are then disseminated online through interactive stereo images, which provide illumination control and depth information. VRLM reproduces capabilities of actual reflected-light microscopy.